Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions

Extreme ultraviolet spectra of Na-like and Mg-like Os Ir were recorded at the National Institute Standards Technology using a grazing incidence spectrometer. We report method in EBIT spectral analysis that reduces signals from contaminant lines known or unknown origin. utilize similar ion charge distributions heavy highly charged ions create potentials for lighter contaminating background elements. First-order approximations to are presented demonstrate differences between impurity elements with without present.