منابع مشابه
Trends in R&D in TSV Technology for 3D LSI Packaging
Small, high-speed, and multi-functional computers and other electronic devices have been enabled by high integration technologies that have come to reality by the miniaturization through the LSI process scaling which uses a very fine pattern. However, an upper limit in the progress of such miniaturization has come into sight. The miniaturization will be technologically limited due to the increa...
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LSIs that adopt advanced technologies, as represented by imaging LSIs, now contain 30 million or more logic gates and the scale is beginning to approach the level of 100 million gates. As compared with the 90 nm process generation, this is three to ten times the number of gates. With advanced technologies such as 40 nm and 28 nm, the process characteristics become remarkably complex and wiring ...
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Chemical sensors are one of the oldest fields of research closely related to the semiconductor technology. From the IonSensitive Field-Effect Transistors (ISFET) in the 70’s, through MicroElectro-Mechanical-System (MEMS) sensors from the end of the 80’s, chemical sensors are combining in the 90’s MEMS technology with LSI intelligence to devise more selective, sensitive and autonomous devices to...
متن کاملPast and Future Technology for Mixed Signal LSI
This paper discusses Mixed Signal LSI technology with embedded power transistors. Trends in Mixed Signal LSI technology are explained at first. Mixed signal LSI technology has proceeded with the help of fine fabrication technology and SOI technology. The BEOL transistor is a new development, which uses InGaZnO (IGZO) as its TFT channel material. The BEOL transistor is one future device which en...
متن کاملComputer-Aided Test Generation for Four-Phase MOS LSI Circuits
In this paper a practical approach to generate fault detection tests for four-phase MOS LSI circuits is discussed. Emphasis is given to a computer aid on the generation of both primary output and primary input test sequences. A technique to preset the circuit to predictable logic levels is presented.
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ژورنال
عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems
سال: 1987
ISSN: 0385-4221,1348-8155
DOI: 10.1541/ieejeiss1987.107.3_218