According to aggressive process scaling, reliability issues on semiconductor devices are becoming dominant such as variability, temporal failure and aging degradation. Temporal failures are mainly caused by alpha particles from packages or neutrons from outer space. These particles generate electron-hole pairs to flip memory or flip-flops, which is so-called soft errors. Alpha particles can be ...

This presentation deals with the reliability issues on advanced VLSIs, such as soft errors, BTI (Bias Temperature Instability). It also explains the SOTB (Silicon On Thin BOX) process by the collaboration with Renesas Electronics and VDEC. Temporal failures are mainly caused by alpha particles from packages or neutrons from outer space. These particles generate electron-hole pairs to flip memor...

in this research work, alpha particle detector is made using semi-insulating gaas. a surface barrier detector with a semi-insulating gaas substrate at room temperature with pressure of 10-4 torr under -particle radiation with 5.48 mev of am241 source, have been under investigation. energy resolution of 2 and 3 mm schottky diameter have been matured and compared with the effect of voltage varia...

The characterization of the carriers' multiplication factor is a key issue for design robust and reliable power semiconductor devices assessment their susceptibility to terrestrial cosmic radiation induced failures. A cryostatic setup presented extend applicability non-invasive charge spectroscopy techniques using soft-gamma from an Am241 radioactive source broad class Si SiC devices. relations...