the classical method of process capability analysis necessarily assumes that collected data are independent; nonetheless, some processes such as biological and chemical processes are autocorrelated and violate the independency assumption. many processes exhibit a certain degree of correlation and can be treated by autoregressive models among which the autoregressive model of order one (ar (1)) ...

Process quality and delivery time have received increasing attention in the highly competitive electronics industry. Many studies have proposed process capability indices (PCIs) to assess process effectiveness. However, methods to assess the performance in terms of processing and delivery times of products have seldom been discussed. The conventional PCIs can no longer assess the processing tim...

the aim of this study was to develop an optimal sustainable forest plantation based on goal programming and analytic hierarchy process (ahp) methods. this study was carried out in guilan province, north of iran. first of all, the ecological capability of the study area for plantation establishment/maintenance was evaluated based on multi-factor method and specific ecological makhdoum model by m...

Process capability indices CPU and CPL have been widely used in the microelectronics manufacturing industry as capability measures for processes with one-sided specification limits. In this paper, the theory of statistical hypothesis testing is implemented for normal processes, using the uniformly minimum variance unbiased estimators of CPU and CPL. Efficient SAS computer programs are provided ...

Process capability indices (PCIs) have been widely used in industries for assessing the capability of manufacturing processes. Castagliola and Castellanos (Quality Technology and Quantitative Management 2005, 2(2):201–220), viewing that there were no clear links between the definition of the existing multivariate PCIs and theoretical proportion of nonconforming product items, defined a bivariat...

In the manufacturing industry, many product characteristics are of one-sided tolerances. The process capability indices C p (u, v) and C l p(u, v) can be used to measure process performance. Most research work related to capability indices assumes no gauge measurement errors. This assumption insufficiently reflects real situations even when advanced measuring instruments are used. In this paper...