سعادت زاده, علی اصغر

[ 1 ] - لچ استاتیک مقاوم در برابر خطای نرم با تأخیر و توان مصرفی پایین

The importance of the reliability in circuits, especially the effect of cosmic ray and the faults caused by the particles hit are becoming increasingly important as the CMOS technology progresses from sub-micrometer to nanometer scale. In this paper a static latch presented which is resistant to soft error caused by energetic particles hit to the surface of the chip and suitable for high reliab...