نتایج جستجو برای: accelerated life testing
تعداد نتایج: 1122069 فیلتر نتایج به سال:
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In this article, we discuss the optimal and robust designs for accelerated life testing (ALT) when a step-stress plan is performed. It is assumed that the time to failure of a product has a Weibull distribution with a log-linear life-stress relationship. We adopt a generalized Khamis-Higgins model for the effect of changing stress levels. Taking into account that the assumed life-stress relatio...
Requirement 1—To use reliable components. This means ICs with a sufficiently low FIT rate. FIT rates are often calculated according to standards such as IEC 62380 or SN 29500, which base their results on the average failure rate seen in the field for various types of components. Alternatively, data can be based on accelerated life testing such as that found at analog.com/ReliabilityData. One im...
Abstract: This paper presents the optimal design for accelerated life testing (ALT) experiments when step-stress plans with Type I censoring are performed. We adopt a generalized Khamis-Higgins model for the effect of changing stress levels. It is assumed that the lifetime of a test unit follows a Weibull distribution, and both its shape and scale parameters are functions of the stress level. T...
The 2-parameter family of probability distributions introduced by Birnbaum & Saunders characterizes the fatigue failure of materials subjected to cyclic stresses and strains. It is shown that the methods of accelerated life testing are applicable to the Birnbaum–Saunders distribution for analyzing accelerated lifetime data, and the (inverse) power law model is used due to its justification for ...
is an open access repository that collects the work of Arts et Métiers ParisTech researchers and makes it freely available over the web where possible. This paper presents an accelerated life testing method applicable to devices or systems when no analytical relationship with respect to the stress level can be defined. If a numerical approach remains possible, the numerical model can be fitted ...
Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climat...
Today's manufacturers face increasingly intense global competition. To remain pro table, they are challenged to design, develop, test, and manufacture high reliability products in ever-shorter product-cycle times and, at the same time, remain within stringent cost constraints. Design, manufacturing, and reliability engineers have developed an impressive array of tools for producing reliable pro...
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