نتایج جستجو برای: accelerated life testing

تعداد نتایج: 1122069  

2011
Cigdem Akkaya Manuela Obermeier Petra Wolf Helmut Krcmar

User acceptance plays a pivotal role in success of all IS projects. Yet, most of the e-government endeavors worldwide have fallen short of their potential. Online transactions with public administrations are plagued with concerns of data protection and privacy resulting in reluctance to engage in egovernment. Although trust is confirmed to be an effective instrument for dealing with the anxiety...

2013
Xiaojian Xu Scott Hunt

In this article, we discuss the optimal and robust designs for accelerated life testing (ALT) when a step-stress plan is performed. It is assumed that the time to failure of a product has a Weibull distribution with a log-linear life-stress relationship. We adopt a generalized Khamis-Higgins model for the effect of changing stress levels. Taking into account that the assumed life-stress relatio...

2016
Tom Meany

Requirement 1—To use reliable components. This means ICs with a sufficiently low FIT rate. FIT rates are often calculated according to standards such as IEC 62380 or SN 29500, which base their results on the average failure rate seen in the field for various types of components. Alternatively, data can be based on accelerated life testing such as that found at analog.com/ReliabilityData. One im...

2012
SCOTT HUNT XIAOJIAN XU X. Xu

Abstract: This paper presents the optimal design for accelerated life testing (ALT) experiments when step-stress plans with Type I censoring are performed. We adopt a generalized Khamis-Higgins model for the effect of changing stress levels. It is assumed that the lifetime of a test unit follows a Weibull distribution, and both its shape and scale parameters are functions of the stress level. T...

Journal: :IEEE Trans. Reliability 2000
W. Jason Owen William J. Padgett

The 2-parameter family of probability distributions introduced by Birnbaum & Saunders characterizes the fatigue failure of materials subjected to cyclic stresses and strains. It is shown that the methods of accelerated life testing are applicable to the Birnbaum–Saunders distribution for analyzing accelerated lifetime data, and the (inverse) power law model is used due to its justification for ...

Journal: :Quality and Reliability Eng. Int. 2010
P. Lantiéri F. Guérin R. Hambli

is an open access repository that collects the work of Arts et Métiers ParisTech researchers and makes it freely available over the web where possible. This paper presents an accelerated life testing method applicable to devices or systems when no analytical relationship with respect to the stress level can be defined. If a numerical approach remains possible, the numerical model can be fitted ...

Journal: :Microelectronics Reliability 2010
Neftalí Núñez Manuel Vázquez José Ramón González Carlos Algora P. Espinet

Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climat...

Journal: :Journal of the Korean Society of Tribologists and Lubrication Engineers 2014

1999
William Q. Meeker Michael Hamada

Today's manufacturers face increasingly intense global competition. To remain pro table, they are challenged to design, develop, test, and manufacture high reliability products in ever-shorter product-cycle times and, at the same time, remain within stringent cost constraints. Design, manufacturing, and reliability engineers have developed an impressive array of tools for producing reliable pro...

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