This paper presents a new approach to static parameters testing of analog-to-digital converters (ADCs). In comparison to ordinary approaches, the measured transition levels are not related to zero potential but to the transition levels of a reference ADC, which is of the same type as a tested ADC. These differences, which can be in the extreme case in the range of a few least significant bits (...

A method of testing for parametric faults of analog circuits based on a polynomial representaion of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies apart from DC. Classification of CUT is based on a comparison of the estimated polynomial coefficients with those of the ...

Abstract: This paper describes a new approach in testing static parameters of analog-to-digital converters (ADCs). The input of an ADC to be tested is connected to a generator of saw-tooth impulses. In comparison to ordinary approaches, the measured decision levels are not related to zero potential but to the decision levels of an additional ADC, which is of same type as tested ADC. Approximati...

A low cost method for testing analog RF signal paths suitable for BIST implementation in a SoC environment is described. The method is based on the use of a simple and low-cost one-bit digitizer that enables the reuse of processor and memory resources available in the SoC, while incurring little analog area overhead. The proposed method also allows a constant load to be observed by the circuit,...

An automated system for dynamic testing of ISA, PCI and VXI modules in frequency range up to 1 MHz developed at Department of Measurement of FEE CTU Prague is presented. The application of the Hewlett-Packard E1430A high precision VXIbus digitizer for evaluation of testing signals is described.

Dynamic supply current (IDD) analysis has emerged as an e ective way for defect oriented testing of analog circuits. In this paper, we propose using wavelet decomposition of IDD for fault detection in analog circuits. Wavelet transform has the property of resolving events in both time and frequency domain simultaneously unlike fourier expansion which localizes a signal in terms of frequency onl...

The translation of the specification of an analog device into the necessary set of measurements to be carried out by an industrial test facility, is discussed. Algorithms are developed to compute the number of testvectors needed to guarantee a certain parameter and to compare several possible testmethods, based on accuracy. An important input for these algorithms: the measurement error is also ...