Scanning probe microscopy has emerged as a powerful approach to a broader understanding of the molecular architecture of cell walls, which may shed light on the challenge of efficient cellulosic ethanol production. We have obtained preliminary images of both Populus and switchgrass samples using atomic force microscopy (AFM). The results show distinctive features that are shared by switchgrass ...

Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer...

A cuboid structure was constructed using a DNA origami design based on a square prism structure. The structure was characterized by atomic force microscopy (AFM) and dynamic light scattering. The real-time opening event of the cuboid was directly observed by high-speed AFM.

Very smooth thin films of iridium have been deposited on super polished fused silica (SiO2) substrates using dc magnetron sputtering in argon plasma. The influence of deposition process parameters on film micro roughness has been investigated. In addition, film optical constants have been determined using variable angle spectroscopic ellipsometery, over the spectra range from vacuum ultraviolet...

We introduce a lateral atomic force microscopy (AFM) method to measure the hydrodynamic drag force acting on a microscopic emulsion droplet moving parallel to a flat surface. A tetradecane oil droplet formed in an aqueous solution of sodium dodecylsulfate was attached to a V-shaped atomic force microscopy cantilever, and lateral hydrodynamic interactions between the droplet and a flat glass sur...

Nickel films of 150 nm thickness were deposited on 304 stainless steel and post annealed under flow of nitrogen at different temperatures. The prepared samples were corrosion tested in 1.0 M H2SO4 solution using potentiodynamic polarization technique. Crystallographic and morphological structure of the samples were analysed by X-ray diffraction XRD and atomic force microscopy AFM respectively b...

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic def...

atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...

We examine the effect of van der Waals (vdW) interactions between atomic force microscope tips and individual carbon nanotubes (CNTs) supported on SiO2. Molecular dynamics (MD) simulations reveal how CNTs deform during atomic force microscopy (AFM) measurement, irrespective of the AFM tip material. The apparent height of a single(double-) walled CNT can be used to estimate its diameter up to ~2...