The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, ...

In atomic force microscopy, cantilevers with a reflective coating are often used to reduce optical shot noise for deflection detection. However, static AFM experiments can be limited by classical noise and therefore may not benefit from a reduction in shot noise. Furthermore, the cantilever coating has the detrimental side-effect of coupling light power fluctuations into true cantilever bending...

Mg–Zn–Y ternary alloys containing the long-period stacking ordered (LPSO) phase exhibit superior mechanical properties. This is believed to be originating from LPSO acting as strengthening phase. However, we first clarify that properties of matrix Mg solid solution in Mg/LPSO two-phase alloy are significantly different those pure Mg. The yield stress a Mg99.2Zn0.2Y0.6 single crystal (matrix sol...

We measure the infrared spectra of polyethylene nanostructures of height 15 nm using atomic force microscope infrared spectroscopy (AFM-IR), which is about an order of magnitude improvement over state of the art. In AFM-IR, infrared light incident upon a sample induces photothermal expansion, which is measured by an AFM tip. The thermomechanical response of the sample-tip-cantilever system resu...

We study the influence of the contact stiffness and the ration between cantilever and tip lengths on the resonance frequencies and sensitivities of lateral cantilever modes. We derive expressions to determine both the effective resonance frequency and the mode sensitivity of an atomic force microscope (AFM) rectangular cantilever. Once the contact stiffness is given, the resonance frequency and...

We describe a novel and simple operation method of using a self-sensitive cantilever of an atomic force microscopy (AFM) system in liquid. As for operation of the cantilever in liquid, Al lines of an integrated piezoresistor patterned on the cantilever are easily damaged by electrochemical corrosion. To realize safe operation without the damage, an additional electrode was inserted into the liq...

Abbreviations a 1 , a 2 , a 3 , a 4 and A 1 , A 2 , A 3 , A 4 Constants in the shape function y(x) a C Contact radius α Wave number of the flexural waves A Cross-section area of the cantilever b Thickness of the cantilever c P Ratio φ Lat /φ d Y 0 , d X0 Normalized amplitude of the sensor tip in y-and x-direction, respectively δ n , δ L Normal, lateral contact deflection (in the coordinate syst...

We find that the 'jump-into-contact' of the cantilever in the atomic force microscope (AFM) is caused by an inherent instability in the motion of the AFM cantilever. The analysis is based on a simple model of the cantilever moving in a nonlinear force field. We show that the 'jump-into-contact' distance can be used to find the interaction of the cantilever tip with the surface. In the specific ...

The attachment of an antibody to an antigen-coated cantilever has been investigated by repeated experiments, using a cantilever-based detection system by Cantion A/S. The stress induced by the binding of a pesticide residue BAM (2,6 dichlorobenzamide) immobilized on a cantilever surface to anti-BAM antibody is measured using the CantiLab4© system from Cantion A/S with four gold-coated cantileve...

We numerically explore the nonlinear dynamics of the oscillating cantilever tip in tapping mode atomic force microscopy. The cantilever dynamics are determined by complex force interactions between the sample surface and the oscillating cantilever tip which are dominated by attractive, adhesive, and repulsive contributions depending on the instantaneous position of the cantilever. We use a mode...