Control limits in traditional Multivariate Quality Control Charts (MQCC), such as Hotelling's T control chart, Multivariate Cumulative Sum (MCUSUM) and Multivariate Exponentially-Weighted Moving Average (MEWMA) control charts are based on multivariate normal assumption. This assumption is not usually satisfied, especially in real life applications. The purpose of a control chart based on suppor...

The wafer defects influence the yield of a wafer. The integrated circuits (IC) manufacturers usually use a Poisson distribution based c-chart to monitor the lot-to-lot wafer defects. As the wafer size increases, defects on wafer tend to cluster. When the c-chart is used, the clustered defects frequently cause erroneous results. The main objective of this study is to develop a hierarchical adapt...

Control charts are extensively used in manufacturing contexts to monitor production processes. This article illustrates economical design of a variable sample size and control limit Hotelling’s T2 control chart based on a novel cost model when occurrence times of the assignable causes are exponentially distributed. The proposed nonlinear cost model is an extension of Duncan’s (J Am Stat ...