We define the dielectric constant (susceptibility) that should enter the Maxwell boundary value problem when applied to microscopic dielectric interfaces polarized by external fields. The dielectric constant (susceptibility) of the interface is defined by exact linear-response equations involving correlations of statistically fluctuating interface polarization and the Coulomb interaction energy...

We derive a method for the determination of the dielectric constant and thickness of a thin dielectric layer, deposited on top of a thick dielectric layer which is in turn present on a metal film. Reflection of pand s-polarlzed light from the metal layer yields minima for certain angles of incidence where the light is absorbed by the metal. The thin dielectric layer causes shifts in the angles ...

In this work we have evaluated the dielectric properties of poly vinylidene fluoride (PVDF) thin films of thickness (≈ 20μm) as a function of temperature from 40-70C and frequency varying from 500 Hz to 100 kHz respectively for Al-Al and Cu-Cu electrode configuration. The dielectric constant values increases with the increase in temperature. A broad peak is found at around (70±5)0C. The maximum...