We present a new low-power BIST (built-in-self-test) for sequential circuits. State correlation analysis is first performed on the flip-flop values in the relaxed, compacted sequence for the undetected faults to extract spatial correlations among the flip-flops. The extracted spatial correlation matrix not only provides additional metrics through which the scan order may be altered, but also al...

Increasing number of pins or gates in the latest LSI’s requires a lot of testing resources. The conventional scan-based testing requires a costly tester (ATE) equipped with a lot of pin electronics. Since reducing the testing cost is a crucial issue in industry, we have introduced an approach using scan-based logic BIST to solve this problem. The logic BIST has applied to many ASIC design chips...

We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for industrial circuits up to 100K gates with 10,000 test patterns, at a total area cost for BIST hardware of typically 5%-15%. It is demonstrated that a tradeoff is possible between test quality, test time, and silicon a...

Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Register (MISR). The root cause of the failure must be initially narrowed down to the failing vectors and also the scan cells at which mismatches occurred. In this work, we propose a method for accurately determining the firs...

1. Introduction Logic Built-In Self-Test (BIST) schemes based on STUMPS structure use on-chip circuitry to generate test stimuli and analyze test responses, with little or no help from an ATE. The STUMPS (Self-Test Using a MISR and Parallel Shift register sequence generator) structure applies pseudo-random patterns generated by a PRPG (Pseudo-Random Pattern Generator) to a full-scan circuit in ...

Built-in self-test (BIST) is an attractive approach to detect delay faults because of its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique that has been successfully applied to stuck-at fault testing. As delay faults have lower random pattern testability than stuck-at faults, the need for DLBIST schemes has increased. However, an extension to delay fault test...

abstract background: in nursing, self-efficacy is quite critical for skill performance. some factors might influence and predict self-efficacy in nurses. thus, the present study aimed to investigate self-efficacy and the factors predicting nurses’ self-efficacy in clinical setting. materials and methods: in this cross-sectional study, 264 nurses were selected from five hospitals affiliated to s...

the cancerous spread of slum has been a rampant problem in urban areas worldwide. the acute shortage of housing facilities compels the poor to live in slums. proper rehabilitation is considered as a very essential remedial measure to provide better living environment to slum peoples. this study is an essential attempt to gauge the effectiveness of a rehabilitation program, which studies the cha...

background and purpose: regarding the role of body image and self-esteem in mental health in women, research examined the mediating role of self-esteem and body image in relation to the self-compassion and mental health in female students research method: the population is composed of girl students of payam noor of delfan city. for this purpose, 280 students were selected by random cluster samp...

a survey of relationship between perceived self-efficacy and self-care performance in diabetic patients referring to urmia diabetes center     khezerloo s [1] *, feizi a [2]     received: 13apr, 2012 accepted: 23may, 2012     abstract   background & aims : diabetes is a chronic and disabling disease. in diabetes, self-caring promotes the quality of life and reduces the number of hospitalization...