Previous experimental studies have provided evidence that closed contours are easier to detect than open contours in random-element displays, and previous theoretical studies have shown that these effects might be explained by an active neural mechanism (e.g., a "reverberating neural circuit") sensitive to closure. To test this hypothesis, detection thresholds were measured in five experiments ...

In this paper, we present coarse-grain and fine-grain diagnosis techniques to identify a faulty element in FPGA interconnects. The fault model we use is stuck-open and resistive-open for interconnects. The presented technique requires only a small number of configurations while offering high resolution diagnosis. We implemented this technique on real FPGA chips and verified it using fault emula...