One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key parameters affecting performance of integrated circuits [1]. Although scaling made controlling extrinsic variability more complex, nonetheless, the most profound reason for the future increase in parameter variability is that the technology is approaching the regime of funda...

In this paper we consider a cutting process for random mappings. Specifically, for 0 < m < n, we consider the initial (uniform) random mapping digraph Gn on n labelled vertices, and we delete (if possible), uniformly and at random, m non-cyclic directed edges from Gn. The maximal random digraph consisting of the uni-cyclic components obtained after cutting the m edges is called the trimmed rand...