X-ray diffractometers primarily designed for surface x-ray diffraction are often used to measure the from powders, textured materials, and fiber-texture samples in so-called $2\theta$ scans. Unlike high-energy powder only a fraction of rings is typically measured data consists many detector images across range. Such scan directions not possible on conventional lab-diffractometer, which gives en...

A method is outlined that allows the determination of one-dimensional stress gradients at length scales greater than 0.2 mm. By using standard four-circle X-ray diffractometer equipment and simple aperture components, length resolutions down to 0.05 mm in one direction can be achieved through constant orientation of a narrow, line-shaped beam spot. Angle calculations are given for the adjustmen...

Well-shaped single crystals of binary AuSn2 were obtained as a side product during the synthesis of LiAu3Sn4. The structure of AuSn2 has been studied by X-ray diffractometer data: Pbca, Z = 8, a = 689.8(1), b = 701.1(1), c = 1177.3(2) pm, wR2 = 0.0533, 1234 F2 values, and 29 variables. The gold atoms show a distorted octahedral coordination by tin at Au–Sn distances ranging from 272 to 283 pm. ...

The new silicide NbPdSi was prepared by melting the elements in an arc-furnace. Well-shaped single crystals were obtained by annealing the sample in an induction furnace. The structure of NbPdSi has been studied by X-ray powder and single crystal diffractometer data: TiNiSi type, Pnma, Z = 4, a= 643.0(1), b= 376.7(1), c= 744.4(2) pm, wR2= 0.0330, 346 F2 values, and 20 variables. The palladium a...