Total reflection X-Ray Fluorescence (TXRF) is a comparatively new technique of material characterization and trace element analysis. It is an advanced variant of Energy Dispersive X-ray Fluorescence (EDXRF) and is based on the principle of total reflection of X-rays when these radiations fall on a flat smooth surface at a grazing angle less than the critical angle of the sample support. The cri...

X-ray absorption spectral (XAS) analysis is performed with a combination of a 9 V dry electric battery X-ray generator and a portable Si PIN X-ray detector. The calcium K edge (4.0 keV) in paper is measured with a grazing incidence geometry, which suppressed the artifact due to the Kalpha X-ray fluorescence peak at 3.5 keV. The 9 V dry battery X-ray emitter is useful for portable XAS measurements.

A new tris-chelate Cd(II) complex, [Cd(DADMBTZ)3](ClO3)2 has been successfully synthesized and characterized by IR, 1H, 13C NMR spectroscopy, elemental analysis and single crystal X-ray determination. The thermal behavior, UV-Vis and fluorescence spectra of compound were studied. In reaction with DADMBTZ, Cadmium (II) forms a tris-chelate complex with nearly C3 symmetry for coordination polyhed...

Cryogenic, high-resolution X-ray detectors have potential applications in industrial .X-ray fluorescence (XRF) analysis. We discuss various XRF analysis techniques currently used in the semiconductor industry, problems encountered clue to limitations of current detectors and the potential benefits of using cryogen ic detectors in these applications. We give examples of demonstration experiments...