We present a setup for time-resolved spectroscopic ellipsometry in pump–probe scheme using femtosecond laser pulses. As probe, the system deploys supercontinuum white light pulses that are delayed with respect to single-wavelength pump A polarizer–sample–compensator–analyzer configuration allows ellipsometric measurements by scanning compensator azimuthal angle. The transient parameters obtaine...

A consistent methodology is presented to extract carrier concentrations in n-type Ge from measurements of the infrared dielectric function and Hall effect. In case optical measurements—usually carried out using spectroscopic ellipsometry—the concentration affected by doping dependence conductivity effective mass, which computed a model electronic density states that accounts for non-parabolicit...

This study investigated the behavior and molecular organization of synthetic artificial mimic molecules that resemble the following tetraether lipids: di-O-hexadecyl-glycero-3-phosphatidyl-glycerol (DHGPG) and bis-4-dodecylphenyl-12-phosphate. These molecules were analyzed using Langmuir film balance, ellipsometry and atomic force microscopy. The monolayer LangmuirBlodgett films of DHGPG and bi...

Absorption properties of type-II InAs/InAsSb superlattices measured by spectroscopic ellipsometry" (2015).

Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry" (2015).

Ellipsometry is a highly sensitive optical technique for coating characterization but usually presents multiple solutions in many cases. To prevent these, a method with addition of a spectral polarimetric technique is proposed. An initial film dispersion curve, independently of its physical thickness, is then provided using the same setup as spectral ellipsometry and at the same sample position...

We explore the effect of temperatures between 80 and 720 K on energy linewidth zone-center transverse (TO) longitudinal (LO) optical phonons in bulk gallium phosphide (GaP) using Fourier transform infrared ellipsometry from 0.03 to 0.60 eV. extract phonon parameters GaP by fitting ellipsometric angles with Lowndes–Gervais model, which applies two different broadening TO LO phonons. In GaP, two-...

Infrared ellipsometry on hexagonal and cubic boron nitride thin films" (1997).

In the past, terahertz spectroscopy has mainly been performed based on time-domain systems in a transmission or window/prism-supported reflection configuration. These conventional approaches have limitations regard to characterizing opaque solids, conductive thin films, multiple-layer structures, and anisotropic materials. Ellipsometry is self-reference characterization technique with wide adap...

Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry" (2009). Faculty Publications from Nebraska Center for Materials and Nanoscience. Paper 99.