نتایج جستجو برای: schottky effect

تعداد نتایج: 1644830  

2005
Woochul Jeon Victor L. Granatstein

Title of Dissertation: DESIGN AND FABRICATION OF ON CHIP MICROWAVE PULSE POWER DETECTORS Woochul Jeon, Doctor of Philosophy, 2005 Directed By: Professor John Melngailis Department of Electrical and Computer Engineering On-chip microwave pulse-power detectors are promising devices for many electrical systems of both military and commercial applications. Most research in microwave power detector ...

2015

Rev. Introduction Since the introduction of commercial silicon carbide (SiC) Schottky diodes over 10 years ago, significant improvements in power factor correction (PFC) circuits and motor drives have been realized due to the elimination of minority carrier reverse recovery charge and its resulting switching loss associated with traditional PiN diodes. The early adoption of SiC Schottky diodes ...

2012
Edgar Cilio Alan Mantooth

A software program for on-state parameter extraction is presented for the realization of a high quality model for SiC Schottky, Merged PiN Schottky, and PiN Power diodes based on McNutt and Mantooth's Comprehensive SiC Diode model [ 1 ].

2001
A. W. Kleinsasser T. N. Jackson

We describe current-voltage measurements on superconducting Nb/lnGaAs junction field-effect transistors which reveal a crossover from tunneling-dominated to Andreev scattering-dominated transport at the superconductor-semiconductor contacts as Schottky barrier thickness decreases with increasing interfacial dopant concentration. These measurements are the first demonstration of such a crossover...

2016
Henri Tranduc P. Rossel Jacques Graffeuil C. Azizi G. Nuzillat G. Bert

2014 In this paper, the experimental results describing the substrate bias effect on the Schottky gate capacitance-voltage and the DC current-voltage characteristics of GaAs FET’s (N-type epilayer on semi-insulating Cr-doped substrate) are reported. These results are accounted for by the formation of a double space-charge in the N-layer and in the S.I. substrate in the vicinity of the interface...

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