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Attaining Board Certification should be a goal of every orthodontic resident, orthodontic educator, and practicing orthodontist. The Board Certification process requires commitment, persistence, firmness of purpose, and sacrifice. Procrastination is the first error along the way to becoming certified. There are many reasons in support of achieving Board Certification, but undoubtedly the most s...
A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution precipitates solute clusters observed in the alloy are not differ between standard electropolishing methods preparation. Enabled by site specific specimen preparation, analysis α-Al(Fe,Mn)Si dispersoid shows segregati...
Atom Probe (AP) tomography is maturing into a routine method for the atomic resolution compositional analysis of metals, semiconductors and some polymers. This is often combined with a Transmission Electron Microscope (TEM) analysis of the same region of interest. The Focused Ion Beam (FIB) microscope has evolved as an essential tool for site and orientation specific sample preparation for such...
Transmission electron microscopy (TEM) is a powerful tool for the investigation of the microstructure of materials, providing crystallographic information and composition at the nanometer scale. For such studies, samples should be transparent to the electron beam. In this review, TEM sample preparation techniques for different classes of materials, such as metals and alloys, multilayered coatin...
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