the effect of evaporation rate on structural, morphological and optical properties of electron beam evaporated cds thin films have been investigated. cds thin film deposited by electron beam evaporation method in 12nm/min and 60nm/min evaporation rates on glass substrates. x-ray diffraction, scanning electron microscopy, uv-vis-nir spectroscopy and atomic force microscopy were used to character...

as we know sol-gel is one of the most important techniques for thin film preparation. in this paper, high transmission silica thin films have been prepared by dip-coating process from a new silicon-alkoxide solution. the prepared sol was stable for 45 days which is very important to characterize the coating process. the optical properties as a function of aging time, withdrawal rate, and heat t...

in this study, tio2 and zno nanofilms were prepared by sol-gel spin-coating method. nanofilms were characterized by x-ray diffraction (xrd), energy dispersive analysis of      x-ray (edx), scanning electron microscopy (sem) and field emission scanning electron microscopy (fe-esm). structural and morphological properties of nanofilms were investigated. the average crystalline size of tio2 and zn...

thin bonded films have many applications in antireflection and reflection coating, insulating and conducting films and semiconductor industries. thermal conductivity is one of the most important parameter for power packaging since the thermal resistance of the interconnections is directly related to the heat removal capability and thermal management of the power package. the defects in material...

Current methodologies used for the inference of thin film stress through curvature measurement are strictly restricted to stress and curvature states that are assumed to remain uniform over the entire film/substrate system. These methodologies have recently been extended to a single layer of thin film deposited on a substrate subjected to the non-uniform misfit strain in the thin film. Such met...

CdTe thin films with 2.8 µm thickness were deposited by electron beam evaporation method. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and atomic force microscopy (AFM) were used to characterize the films. The results of AFM analysis revealed that the CdTe films have uniform surface. CdTe thin films were heat-treated by SnCl2 solution. Structural analysis using XRD s...

co-fe films were electrodeposited on cu substrate from electrolytes with different co concentration  levels. x-ray diffraction (xrd) was used  to  investigate  the  films  crystal  structures. the  results  indicate that  if  the  co  concentration  is  less  that  the  fe  concentration,  the cubic  structure  appears  in  the  films, while  the  hexagonal  structure dominates when  the co  co...

Article history: Received 26 June 2016 Accepted 7 July 2016 Available online xxxx In the thin film transistors (TFTs) device research for foldable display, the degradation effect by the mechanical stress is crucial. Here, the crack position is critical for TFT reliability. However, it is difficult to characterize the crack position due to the random generation of the crack by mechanical stress....

The global thin film transistor-liquid crystal display (TFT-LCD) manufacturers concentrate in Korea, Japan and Taiwan. In view of growing rapidly of demand in the world, the competition of TFT-LCD manufacturers has been a fierce phenomenon. The most important subject for every TFT-LCD manufacturer administrator is how to make the best disposition of resources and create more and more profits. T...