Defect parameter extraction plays an important role in process control and yield prediction. A methodology of evaluating wafer level defect clustering will be presented to detect equipment specific particle contamination. For that, imaginary wafermaps of a variety of different chip areas are generated to calculate a yield-to-area dependency. Based on these calculations a Micro Density Distribut...

Progress made over the last several years in early identification of hearing loss through implementation of newborn hearing screening (NHS) programs has created a unique opportunity for audiologists to provide amplification to children with permanent hearing loss (PHL) very early in life. Along with this long-awaited opportunity comes the daunting responsibility for accurately determining the t...

the modeling can provide a quantitative approach and consistency in the estimationsoil erosion and sediment yield by a wide range of conditions. in this study, the integration method of revised universal soil loss equation model, geographic information system and remote sensing techniques were used in order to identify the spatial distribution of soil erosion and sediment yield in the talar wat...