In this paper, a complete functional testing of embedded ADC is presented. The integral non-linearity error, INLE, differential non-linearity error, DNLE, offset error, OSE, gain error and the signal-to-noise ratio, SNR are tested. The problem related to the propagation of the analog signal to the input of the ADC and the observation of the digital output of the converter at the output of the d...

pistacia khinjuk (stocks) is a native species that, along with p. atlantica, is widely distributed from eastern to western iran through the makran zone, zagros mountains and the sanandaj-sirjan zone, ranging from 50 to 3300 m above sea level. the identification of resistance gene analogs holds great promise for developing resistant plants. a pcr approach with degenerate primers designed from co...

This paper deals with the virtual testing environment for analog-to-digital converters (ADCs) employing a novel and powerful extension of the Servo-Loop method [1], [4]. We build an improved version of the Servo-Loop targeted to full transistor-level circuit simulation of static integral and differential ADC non-linearity. In comparison with the conventional implementation, the ServoLoop versio...

The continuous increase of integration densities in Complementary Metal–Oxide–Semiconductor (CMOS) technology has driven the rapid growth of very large scale integrated (VLSI) circuit for today's high-tech electronics industries from consumer products to telecommunications and computers. As CMOS technologies are scaled down into the nanometer range, analog and mixed integrated circuit (IC) desi...

Rev. A Circuits from the LabTM circuits from Analog Devices have been designed and built by Analog Devices engineers. Standard engineering practices have been employed in the design and construction of each circuit, and their function and performance have been tested and verified in a lab environment at room temperature. However, you are solely responsible for testing the circuit and determinin...

Sheldon Gilbert 4421 West Estes Lincolnwood, IL 60646 A design for a fully analog version of a self-organizing feature map neural network has been completed. Several parts of this design are in fabrication. The feature map algorithm was modified to accommodate circuit solutions to the various computations required. Performance effects were measured by simulating the design as part of a frontend...

This thesis focuses on a digital Built-in Self-Test (BIST) approach to perform specification oriented testing of the analog portion of a mixed-signal system. The BIST utilizes a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplieraccumulator (MAC) based output response analyzer (ORA) to stimulate and analyze the analog devices under test, respectively. This appro...

Rev.0 Circuits from the LabTM circuits from Analog Devices have been designed and built by Analog Devices engineers. Standard engineering practices have been employed in the design and construction of each circuit, and their function and performance have been tested and verified in a lab environment at room temperature. However, you are solely responsible for testing the circuit and determining...

This paper proposed a new fault diagnosis method based on the extension genetic algorithm (EGA) for analog circuits. Analog circuits were difference at some node with the normal and failure conditions. However, the identification of the faulted location was not easily task due to the variability of circuit components. So this paper presented a novel EGA method for fault diagnosis of analog circ...

Previous panel papers have described testing for NERC and WSCC compliance [A] and testing and tuning of governors for compliance and island-mode performance [B]. This paper presents experience with testing of gas turbine plants for NERC and WSCC compliance. Testing has been performed on older analog-electronic and new digital-electronic units. The level of detail used in modeling and model avai...