The atomic force microscope ~AFM! is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever–sample interaction is devel...

The effects of Surface morphological Properties of Nanostructured Bi1.6Pb0.4Sr2Ca2Cu2.70Zn0.30O10+δ based High Temperature Superconductors have been investigated. Bi1.6Pb0.4Sr2Ca2Cu2.70Zn0.30O10+δ superconducting samples are prepared by solid-state reaction route. Bi1.6Pb0.4Sr2Ca2Cu2.70Zn0.30O10+δ superconductors were prepared in bulk form. The phase identification /gross structural characteris...

An automated algorithm is presented to determine the DNA molecule intrinsic curvature profiles and the molecular spatial orientations in Atomic Force Microscope images. The curvature is composed by static and dynamic contributions. The first one is the intrinsic curvature, vectorial function of the DNA nucletide sequence, while the second one is due to thermal noise. This algorithm allows to re...

A new micro-XRF instrument was developed in combination with an atomic force microscope (AFM). A small pinhole of 5 or 10 μm was made on the AFM cantilever. The center of the micro X-ray beam generated by a polycapillary X-ray lens was passed through the pinhole. The present experiment demonstrated that the size of the original X-ray beam of 48 μm produced by the polycapillary lens was reduced ...

We describe studies of the elastic properties and frictional characteristics of graphene samples of varying thickness using an atomic force microscope. For tensile testing, graphene is suspended over micron-sized circular holes and indented by atomic force microscope (AFM) tips. Fitting of the forcedisplacement curves yields the prestress and elastic stiffness, while comparison of the breaking ...