This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisite testing process is analyzed using device-under-test (DUT) parameters (such as yield and average number of faults per DUT) as well as test process features (such as number of channels, coverage and touchdown time for...

We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testi...

development of the structural form is directly influenced by the architectural concern for aesthetic appeal. the architectural challenge is to create building forms that satisfy the functional requirements, yet are aesthetically and economically successful. the structural challenge is to create structural forms that accommodate the functional requirements while supporting the imposed loads as e...

Formant trajectories of five American English diphthongs embedded in the target words BAIT (/ei/), BITE (/ai/), POUT (/au/), BOAT (/Ou/), BOYS (/oi/) are investigated in the F1-F2 space as a function of age and gender. Age range considered is from 5 to 18 years. In this report, the focus is given to the differences in position between the start/end points of diphthongs and nine monophthons. Ave...

One of the tenets of equilibrium asset pricing models is that expected return of an asset is positively related to its risk (price variability of the asset). In other words, it is expected that assets with higher expected returns are also the ones with higher risk, or assets with lower risk are the ones with lower expected returns. The logic behind this idea is actually is simple and intuitive:...

The main aim of this paper is to design and implement efficient UART and test the UART with built in self testing technique . A new Test pattern generator is simulated and used in BIST architecture in order to reduce power dissipation. As we know that power dissipation is more during the test mode than in normal mode hence In this project the pattern generator used is the low power pattern gene...

Increasing number of pins or gates in the latest LSI’s requires a lot of testing resources. The conventional scan-based testing requires a costly tester (ATE) equipped with a lot of pin electronics. Since reducing the testing cost is a crucial issue in industry, we have introduced an approach using scan-based logic BIST to solve this problem. The logic BIST has applied to many ASIC design chips...

We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for industrial circuits up to 100K gates with 10,000 test patterns, at a total area cost for BIST hardware of typically 5%-15%. It is demonstrated that a tradeoff is possible between test quality, test time, and silicon a...

Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Register (MISR). The root cause of the failure must be initially narrowed down to the failing vectors and also the scan cells at which mismatches occurred. In this work, we propose a method for accurately determining the firs...