Electron backscatter diffraction (EBSD) has evolved into a well-established tool for microstructural characterization by providing quantitative information on crystallographic orientation and phase content and distribution. The rapid acceptance of EBSD as an analytical technique has been driven, in part, by the highly informative contrasts used to create different micrographs which effectively ...

The microstructure evolution of electroplated copper films was characterized by electron backscatter diffraction (EBSD). Special care was taken during the preparation of the cross-sectional specimens and microstructure analysis to obtain reliable results. The film exhibited a columnar grain structure with a large fraction of twin boundaries. Annealing induced normal grain growth and caused many...

We document how dynamic recrystallization by subgrain rotation (SGR) develops in natural olivine-rich rocks deformed extension to up 50% bulk finite strain (1473 K, confining pressure of 300 MPa, and stresses between 115 180 MPa) using electron backscatter diffraction (EBSD) mapping. SGR occurs preferentially highly grains (well-oriented deform dislocation glide) subjected local stress concentr...