نتایج جستجو برای: electron contamination

تعداد نتایج: 359689  

Journal: :Ultramicroscopy 2001
K Danov R Danev K Nagayama

The radial distribution of the beam-induced charge in thin films is investigated using the contrast transfer properties of the transmission electron microscope. The phase shift due to charging is measured as the phase difference between the contrast transfer functions of two photos taken with and without film at the back focal plane. Solving the inverse Laplace problem with this input data reco...

2009
Atsuo Iwasawa Keita Saito Takayuki Mokudai Masahiro Kohno Toshihiko Ozawa Yoshimi Niwano

It is well known that hydroxyl radicals are generated by ultrasound in water. This study with an electron spin resonance spin-trapping technique showed that hydroxyl radical generation was positively correlated with ultrasound duration and water temperature. The clear fungicidal action against Trichophyton spp. evident by studying cultured cells and the degradation of cytoplasmic and surface st...

Journal: :Proceedings of the National Academy of Sciences of the United States of America 1974
S Brown M Teplitz J P Revel

Mycoplasmas were examined on the surfaces of tissue culture cells prepared for transmission and scanning electron microscopy. The pleomorphic bodies seen were proved to be mycoplasmas by the use of thin sections, passage of the infection from one cell line to another, and by autoradiography with [(3)H]thymidine both on the sections and the replicas. The mycoplasmas were not always evenly distri...

2018
Katherine E MacArthur Marc Heggen Rafal E Dunin-Borkowski

Advances in catalysis rely on the synthesis and characterisation of nanoparticles that have tailored structures and compositions. Although energy-dispersive X-ray (EDX) spectroscopy can be used to study local variations in the compositions of individual supported nanoparticles on the atomic-scale in the scanning transmission electron microscope, electron beam induced damage and contamination ca...

1996
A. K. Kulkarni L. C. Chang

Ž . The electrical resistivities of electron beam deposited and sputter deposited chromium thin films 25–500 nm on glass and alumina substrates are correlated with the structural characteristics of the films determined by X-ray diffraction, scanning electron microscope and Auger electron spectrometer. The resistivities of as-deposited chromium films on glass substrates range from 58 to 107 mV c...

Journal: :Archives of histology and cytology 1989
K Tanaka A Mitsushima Y Kashima T Nakadera H Fukudome

In recent years, several ultrahigh resolution scanning electron microscopes (SEM) were successively developed. They were all equipped with a field emission electron gun and an objective lens with a short focal length, and showed a resolution better than 1 nm. With such instrument, not only intracellular structures but also virus, bacteriophages, and biological macromolecules were clearly observ...

2013
Tian Wang Matthew H Pelletier Nicky Bertollo Alan Crosky William R Walsh

BACKGROUND Shape-closed cemented implants rely on a stronger bond and have displayed inferior clinical outcomes when compared to force-closed designs. Implant contamination such as saline, bone marrow and blood prior to cement application has the potential to affect the cement-implant bond. The consequences of implant contamination were investigated in this study. METHODS Fifty Titanium alloy...

2008
H. Shin R. Raju D. N. Ruzic

Reflectivity degradation of grazing-incident extreme ultraviolet (EUV) mirror samples by EUV exposure was investigated in a commercial XTS 13-35 EUV source. The roughness of EUV exposed samples increases with an increase in exposure time due to the erosion of sample surface by ions and neutrals, or deposition of contaminant such as carbon on the sample surface. While energetic debris certainly ...

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