نتایج جستجو برای: electron optics
تعداد نتایج: 340090 فیلتر نتایج به سال:
We demonstrate the use of the classical Ronchi test to characterize aberrations in focusing optics at a hard x-ray free-electron laser. A grating is placed close to the focus and the interference between the different orders after the grating is observed in the far field. Any aberrations in the beam or the optics will distort the interference fringes. The method is simple to implement and can p...
The beam orbit system of the LEP electron-positron collider is able to store the beam position over 1000 turns following a deflection by a horizontal kicker. A precise analysis of such 1000-turn data for many beam position monitors was used to study the dependence of the tune on the horizontal amplitude. The horizontal tune shift with amplitude was determined from the decay of the beam oscillat...
A new optics has been designed for Sirius with improved betatron function matching in the 6 meter-long low beta straight sections for insertion devices. Both horizontal and vertical betatron functions are set to 1.5 m in the center of the section, improving the matching of the electron and undulator photon beams. In addition, the horizontal beam stay clear has also been reduced allowing for sma...
Abstract The electron lens in the Fermilab Integrable Optics Test Accelerator (IOTA) will enable new research nonlinear integrable optics, space-charge compensation, cooling, and stability of intense beams. This addresses scientific questions on high-brightness beams operational challenges high-power accelerators for nuclear particle physics. We review roles that lenses play this field physical...
Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manuf...
Developments in instrumentation are essential to open new fields of science. This clearly applies to electron microscopy, where recent progress in all hardware components and in digitally assisted data acquisition and processing has radically extended the domains of application. The demonstrated breakthroughs in electron optics, such as the successful design and practical realization and the us...
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