For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavior. In this paper, a method is presented for computing the occurrence probabilities of certain defects and the realistic fault coverage for test sets. The method is highly efficient as a pre-processing step is used for...

Because they are comparatively easy to implement, structural coverage criteria are commonly used for test derivation in modeland code-based testing. However, there is a lack of compelling evidence that they are useful for finding faults, specifically so when compared to random testing. This paper challenges the idea of using coverage criteria for test selection and instead proposes an approach ...

Ensuring that a distributed system with strict dependability constraints meets its prescribed speciication is a growing challenge that confronts software developers and system engineers. This paper presents a technique for probing and fault injection of fault-tolerant distributed protocols. The proposed technique, called script-driven probing and fault injection, can be used for studying the be...

We present a new method to generate compact stuckat test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large N-detect pattern repository, by using a new output deviation-based metric. Then it embeds complete coverage of stuck-at faults within these patterns, and also uses the proposed metric to further improve their unmodeled defect c...

The violation of timing constraints on signals within a complex system can create timing-induced functional errors which alter the value of output signals. These errors are not detected by traditional functional validation approaches because functional validation does not consider signal timing. Timing-induced functional errors are also not detected by traditional timing analysis approaches bec...

In this article, we study the assessment of the reliability of redundant systems with imperfect fault coverage. We term fault coverage the ability of a system to isolate and correctly accommodate failures of redundant elements. For highly reliable systems, such as avionic and space systems, fault coverage is in general imperfect and has a significant impact on system reliability. We review here...

A generalized approach is presented to fault simulation and test generation based on a uniform functional fault model for different system representation levels. The fault model allows to represent the defects in components and defects in the communication network of components by the same technique. Physical defects are modeled as parameters in generalized differential equations. Solutions of ...

This paper proposes a behavioral-level test pattern generation algorithm for behavioral VHDL descriptions. The proposed approach is based on the comparison between the implicit description of the fault-free behavior and the faulty behavior, obtained through a new behav-ioral fault model. The paper will experimentally show that the test patterns generated at the behavioral level provide a very h...

This paper proposes a realistic memory fault probability model which predicts the probabilities of memory fault classes for a given process technology. Physical defects in the memory array are classified into five functional fault classes, which are stuck-at, stuck-open, transition, coupling, and data retention faults. Finally, the memory fault coverages of the known memory test algorithms are ...

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this problem a combined delay fault (CDF) model has been developed, which models delay faults caused by the combination of spot defects, parametric process variation, and capacitive coupling. The spot defects are modeled as...