Functional debugging of application specific integrated circuits (ASICs) has been recognized as a very labor-intensive and expensive process. It often dominates the time and cost of the ASIC system development. The difficulty of functional debugging is mainly due to the limited controllability and observability of the storage elements in designs, and therefore the intermediate variables in func...

Testing takes much of the time of the software development process, so several efforts have been devoted to automate it. We present here a tool that is able to generate test cases for Maude functional modules, and check their correctness with respect to a given specification or select a subset of these test cases to be checked by the user by using different strategies. Since these processes are...

Model-based testing uses a test model which defines in general an infinite set of correct system runs. The task for the test case generator is to select an ”interesting” subset of all the traces. The way this subset is chosen is defined by the test case specification. Two types are widely used: structural or functional test case specifications. The first is given in terms over the model element...

Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vectors, guided by miscellaneous coverage metrics to satisfy the simulation target, can be posed as a satisfiability problem (SAT). This paper presents a novel approach to solving SAT based on Constraint Logic Programming (CLP) ...

We develop new statistical methods for estimating functional connectivity between components of a multivariate time series and for testing differences in functional connectivity across experimental conditions. Here, we characterize functional connectivity by partial coherence, which identifies the frequency band (or bands) that drives the direct linear association between any pair of components...

Functional testing of microprocessors has been studied for over two decades. Techniques for generating functional tests for modern microprocessors with cache/MMU and pipelining have been previously proposed [4, 1]. However there are no reported techniques for automatic functional self-test generation for superscalar processors. We present such a technique that not only makes it possible to run ...

AMS subject classifications: 62G10 62G20 62H25 a b s t r a c t Functional panels are collections of functional time series, and arise often in the study of high frequency multivariate data. We develop a portmanteau style test to determine if the cross-sections of such a panel are independent and identically distributed. Our framework allows the number of functional projections and/or the number...

Board functional test has of late been going through a bit of a decline, with the driving factors being cost and time to market and the progress of structural test technologies. Traditional board testers tend to be more the domain of the large volume manufacturers, while today more and more design companies are using subcontracts for PCB manufacture and test. The low volume manufacturers tend n...

This paper presents a new approach to test pattern generation for sequential circuits modeled as finite state machines. Based on a functional fault model, only a restricted set of transitions of the finite state machine (FSM) is considered for the purpose of testing. A new state discriminating sequence, referred to as EUIO is proposed. Overlapping is accomplished to reduce the test length. In m...