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A compact all-fiber plasmonic Airy-like beam generator is demonstrated. A single slit and a 1D groove array were fabricated by focused ion beam milling on the gold deposited end facet of a single-mode optical fiber. The single slit excites the surface plasmonic polaritons (SPPs), which are decoupled into free space by the groove array. The phase of decoupling SPPs is adjusted by the grooves pos...

Coupled dual-beam focused ion beam electron microscopy (FIB-EM) has gained popularity across multiple disciplines over the past decade. Widely utilized as a stand-alone instrument for micromachining and metal or insulator deposition in numerous industries, the submicron-scale ion milling and cutting capabilities of FIB-EM systems have been well documented in the materials science literature. Th...

The feasibility of using a focused ion beam (FIB) for the purpose of thinning vitreously frozen biological specimens for transmission electron microscopy (TEM) was explored. A concern was whether heat transfer beyond the direct ion interaction layer might devitrify the ice. To test this possibility, we milled vitreously frozen water on a standard TEM grid with a 30-keV Ga(+) beam, and cryo-tran...

There is substantial concern about the phase change to artificial ferrite or martensite in commercial austenitic stainless steels during intense focused-ion-beam milling. In this work, severe Ga ion milling prepare microscale samples was found produce thin transformed layers on surface of steel. The BCC transformation layer clearly distinguished specimen processed with focused beam using cross-...

We report that, to enable studies of their compositional, structural and electrical properties, freestanding individual nanoobjects can be selectively felled in a controllable way by the technique of low-current focused-ion-beam (FIB) milling with the ion beam at a chosen angle of incidence to the nanoobject. To demonstrate the suitability of the technique, we report results for zigzag/straight...