ZigBee Light Link (ZLL) is the low-power mesh network standard used by connected lighting systems, such as Philips Hue, Osram Lightify, and GE Link. These lighting systems are intended for residential use but also deployed in hotels, restaurants, and industrial buildings. In this paper, we investigate the current state of security in ZLL-based connected lighting systems. We extend the scope of ...

In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit’s performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodol...

This paper presents a new low power BIST TPG scheme for reducing scan transitions. It uses a transition freezing and melting method which is implemented of the transition freezing block and a MUX. When random test patterns are generated from an LFSR, transitions of those patterns satisfy pseudo-random Gaussian distribution. The proposed technique freezes transitions of patterns using a freezing...

Power dissipation is a challenging problem for today’s system-on-chip design and test. This paper presents a novel architecture which generates the test patterns with reduced switching activities; it has the advantage of low test power and low hardware overhead. The proposed LP-TPG (test pattern generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit ...

A pseudorandom test patterns are generated using low power programmable generator with desired toggling levels and enhanced fault coverage gradient. A linear feedback shift register drives a phase shifter to produce binary sequence using preselected toggling (PRESTO) activity. Several controls of the generator are selected automatically for easy and precise tuning. For shaping the test power en...

In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed...

The Durbin-Wu-Hausman (DWH) test is a commonly used test for endogeneity in instrumental variables (IV) regression. Unfortunately, the DWH test depends, among other things, on assuming all the instruments are valid, a rarity in practice. In this paper, we show that the DWH test often has distorted size even if one IV is invalid. Also, the DWH test may have low power when many, possibly high dim...

The high power consumption during circuit test process can produce unwanted failures or take effects on circuit reliability, therefore the reduction of both peak power and average power of circuit test is necessary. A test pattern generation approach is presented in this paper for the delay faults in digital circuits, the approach makes use of the evolution method with the hybrid strategies to ...

This paper describes a low-power test generation procedure, which targets the switching activity during the fast functional clock cycles of broadside tests. The procedure is based on merging of test cubes that it extracts from functional broadside tests. The use of test cube merging supports test compaction and it can be used for accommodating the constraints of test data compression. The use o...