The structure of the active complex in the Ni-catalyzed polymerization of isocyanides to give polyisocyanides is investigated. It is shown by X-ray absorption spectroscopy (XAS), including EXAFS (extended X-ray absorption fine structure) and XANES (X-ray absorption near edge structure), and single-crystal X-ray diffraction, to contain a carbene-like ligand. This is the first structural characte...

In this paper, polycrystalline pure zinc oxide nano structured thin films were deposited on two kinds of single crystal and polycrystalline of p and n type Si in three different substrate temperatures of 300, 400 and 500◦C by low cost APCVD method. Structural, electrical and optical properties of these thin films were characterized by X ray diffraction, two point probe method and UV visible spe...

Angle dispersive x-ray diffraction (ADXRD) is a basic non destructive tool for the determination of crystal structure. Energy tunability and high flux are added advantages in using synchrotron radiation (SR) source for ADXRD technique. We have installed an ADXRD beamline (BL-12) on Indus-2, the Indian synchrotron source. Indus-2 is a 2.5GeV, 300mA SR source. The beamline consists of a Si (311) ...

PbxBa1−xTiO3 (0.2 x 1) thin films were deposited on single-crystal MgO as well as amorphous Si3N4/Si substrates using biaxially textured MgO buffer templates, grown by ion beam-assisted deposition (IBAD). The ferroelectric films were stoichiometric and highly oriented, with only (001) and (100) orientations evident in x-ray diffraction (XRD) scans. Films on biaxially textured templates had smal...