نتایج جستجو برای: aln

تعداد نتایج: 3323  

Journal: :Nanotechnology 2009
Yafei Li Zhen Zhou Panwen Shen S B Zhang Zhongfang Chen

One-dimensional AlN nanowires/tubes were exploited as hydrogen storage media. The adsorption of atomic and molecular hydrogen on AlN nanowires was investigated by using density functional theory computations. Hydrogen atoms prefer to adsorb on top of neighboring threefold-coordinated N and Al atoms in pairs. A hydrogen molecule, however, prefers to adsorb on top of threefold-coordinated Al atom...

2003
V. V. Ursaki I. M. Tiginyanu V. V. Zalamai D. Pavlidis

AlN/GaN/sapphire heterostructures with AlN gate film thickness of 3–35 nm are characterized using photoreflectivity ~PR! and photoluminescence ~PL! spectroscopy. Under a critical AlN film thickness, the luminescence from the GaN channel layer near the interface proves to be excitonic. No luminescence related to the recombination of the two-dimensional electron gas ~2DEG! is observed, in spite o...

2005
Saravanan. S E. Berenschot G. Krijnen M. Elwenspoek

We report on a novel microfabrication method to fabricate aluminum nitride (AlN) piezoelectric microstructures down to 2 microns size by a surface micromachining process. Highly c-axis oriented AlN thin films are deposited between thin Cr electrodes on polysilicon structural layers by rf reactive sputtering. The top Cr layer is used both as a mask to etch the AlN thin films and as an electrode ...

2015
Wei Wang Chao Chen Guozhen Zhang Ti Wang Hao Wu Yong Liu Chang Liu

ZnO films were prepared on p-Si (111) substrates by using atomic layer deposition. High-resolution x-ray diffraction (XRD), scanning electron microscopy (SEM), x-ray photoelectron spectroscopy (XPS), photoluminescence (PL), and I-V measurements were carried out to characterize structural, electrical, and optical properties. After introducing a 60-nm-thick AlN buffer layer, the growth direction ...

2013
Dung-Sheng Tsai Wei-Cheng Lien Der-Hsien Lien Kuan-Ming Chen Meng-Lin Tsai Debbie G. Senesky Yueh-Chung Yu Albert P. Pisano Jr-Hau He

We demonstrate solar-blind photodetectors (PDs) by employing AlN thin films on Si(100) substrates with excellent temperature tolerance and radiation hardness. Even at a bias higher than 200 V the AlN PDs on Si show a dark current as low as ~ 1 nA. The working temperature is up to 300°C and the radiation tolerance is up to 10(13) cm(-2) of 2-MeV proton fluences for AlN metal-semiconductor-metal ...

Journal: :Diabetes care 2004
Theresa H M Keegan Ann V Schwartz Douglas C Bauer Deborah E Sellmeyer Jennifer L Kelsey

OBJECTIVE Alendronate sodium (ALN) increases bone mineral density (BMD) in heterogeneous populations of postmenopausal women, but its effect is unknown in women with type 2 diabetes. The objective of this project was to compare changes in BMD during 3 years of ALN treatment versus placebo in diabetic women. RESEARCH DESIGN AND METHODS We used data from the Fracture Intervention Trial, a rando...

2016
Bin-Hao Chen Hsiu-Hao Hsu David T.W. Lin

We report the growth of high-quality AlN films on graphene. The graphene films were synthesized by CVD and then transferred onto silicon substrates. Epitaxial aluminum nitride films were deposited by DC magnetron sputtering on both graphene as an intermediate layer and silicon as a substrate. The structural characteristics of the AlN films and graphene were investigated. Highly c-axis-oriented ...

Journal: :Optics letters 2013
Hojoong Jung Chi Xiong King Y Fong Xufeng Zhang Hong X Tang

Aluminum nitride (AlN) is an appealing nonlinear optical material for on-chip wavelength conversion. Here we report optical frequency comb generation from high-quality-factor AlN microring resonators integrated on silicon substrates. By engineering the waveguide structure to achieve near-zero dispersion at telecommunication wavelengths and optimizing the phase matching for four-wave mixing, fre...

2012
Kamran Forghani

We report on the metalorganic vapor phase epitaxial (MOVPE) growth of AlN films on sapphire substrates. The effect of precursor flow rate and nucleation layer (NL) on the film quality was investigated. The films were characterized using AFM, XRD and PL. We could realize AlN films with very smooth surfaces and narrow symmetric XRD peaks indicating low screw/mixed type dislocation densities in th...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه شیراز - دانشکده مهندسی موادو متالورژی 1393

در این تحقیق، رفتار تف جوشی، هدایت حرارتی و استحکام شکست سرامیک های آلومینیوم نیتراید مورد بررسی قرار گرفت. در این راستا، ابتدا با استفاده از عملیات آسیابکاری در محیط الکل خالص، کاهشی در اندازه ذرات پودر خالص aln صورت گرفت. در ادامه نمونه هایی از aln (خالص و حاوی افزودنی های مختلف) به روش پرسکاری تهیه شدند. تف جوشی این نمونه ها در اتمسفر نیتروژن و در دماهای بالاتر ازc ?1650 مورد بررسی قرار گرفت...

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