نتایج جستجو برای: atomic

تعداد نتایج: 91267  

2007
Yongliang Yang Eric Yue Ma J Polesel-Maris L Aeschimann A Meister R Ischer E Bernard T Akiyama M Giazzon P Niedermann U Staufer R Pugin N F de Rooij P Vettiger H Heinzelmann

Atomic Force Microscopy (AFM) techniques are used with oneor two-dimensional arrays of piezoresistive probes for parallel imaging. We present a newly designed AFM platform to drive these passivated piezoresistive cantilever arrays in air and liquid environments. Large area imaging in liquid as well as qualitative and quantitative analysis of biological cells are demonstrated by the means of pie...

2008
Pranav Agarwal Murti V. Salapaka

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه زنجان 1386

چکیده ندارد.

1990
Tatsuo Nakajima Mario Tokoro

The two merits are closely connected with each other. Using non-object based atomic actions, it is di cult to extract semantic information from applications because it is required that the programmers consider the interaction among all atomic actions. Atomic objects enable all applications to be atomic only if every object is atomic. Each object can extract its semantic information independentl...

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