Several different approximations and techniques have been developed for the calculation of atomic structure, ionization, and excitation of atoms and ions. These techniques have been used to compute large amounts of spectroscopic data of various levels of accuracy. This paper presents a review of these theoretical methods to help non-experts in atomic physics to better understand the qualities a...

The electronic properties of semiconducting monolayer transition-metal dichalcogenides can be tuned by electrostatic gate potentials. Here we report gate-tunable imaging and spectroscopy of monolayer MoS2 by atomic-resolution scanning tunneling microscopy/spectroscopy (STM/STS). Our measurements are performed on large-area samples grown by metal-organic chemical vapor deposition (MOCVD) techniq...

Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....

Self-assembled monolayer films based on iodobenzoyloxy-functionalized resorc[4]arenes were prepared on gold substrates to serve as model systems for future time-resolved studies of molecular recognition, a mechanism of outstanding importance in bioorganic systems. The film properties were tested using X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and imaging ellipsometry...

We studied the atomic structure of ultrathin silica films on Pt(111) in comparison with the previously studied films on Mo(112) and Ru(0001). The results obtained by scanning tunneling microscopy, photoelectron spectroscopy and infrared reflection absorption spectroscopy suggest that the metal-oxygen bond strength plays the decisive role in the atomic structure of the silica overlayers on metal...

We present a study of the structure and chemical composition of the Cr-doped 3D topological insulator Bi2Se3. Single-crystalline thin films were grown by molecular beam epitaxy on Al2O3 (0001), and their structural and chemical properties determined on an atomic level by aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy. A regular quintuple lay...

We show that the static force spectroscopy curve taken in an atomic force microscope is significantly modified due to presence of intrinsic cantilever instability which occurs as a result of its movement in a nonlinear force field. This instability acts in tandem with such instabilities as water bridge or molecular bond rupture and makes the static force spectroscopy curve (including 'jump-off-...

Systematic studies of nanocrystalline nickel tungstate, NiWO4, thin films were performed by several experimental techniques such as Ni Kand W L1,3-edges X-ray absorption spectroscopy, X-ray diffraction, Raman spectroscopy, atomic force microscopy and cyclic voltammetry measurements. We found that the NiWO4 thin films exhibit electrochromic properties similar to that of amorphous tungsten trioxi...