نتایج جستجو برای: circuit reliability

تعداد نتایج: 254412  

Journal: :TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES 2020

Journal: : 2023

The process of recrystallization occurring at temperature +80°C in aluminum (Al) conductors integrated circuits (IC) designed to operate the range -40°C -+60°C has been studied experimentally by method cross sections obtained with a focused ion beam (FIB). Using data comparative analysis IC used various operating conditions, mechanism electromigration caused supply voltage under influence eleva...

2013
Yue Feng Xiao-dong Wang Yang Zhao Yun-xia Jiang

Nowaday, the traditional circuit breaker is which action slow, poor reliability, can not meet large grid interconnection and flexible AC transmission requirements. To address those shortcomings of traditional circuit breaker, an idear is put forward that traditional mechanical circuit breaker combinates of power electronic switch-IGCT to build a new type of hybrid circuit breaker device (Hybrid...

2010
RICHARD J. CHUNG A. M. RYBCZYNSKI

Public and private packet-switching networks (PSNs) are being developed or planned throughout the world-for example in Canada (DATAPAC), the U.S. (TELENET), France (TRANSPAC), the U.K. (EPSS), Japan (DDX), Spain, Netherlands and others. 7 Such an explosive development of data communications services is one of the means for attaining the near-perfect availability required from future distributed...

2008
Y.-C. Hung

A high reliability complementary metal–oxide–semiconductor (CMOS) winner-takes-all/ loser-takes-all circuit of O(N) complexity with programmable capability is designed. Based on the proposed architecture, the precision of the circuit is independent of the number of inputs. This circuit is easily programmed for WTA or LTA function by an enable signal, without modifying the circuit structure or p...

2016
P.Lakshmi Priya

As the most quantitative measures of VLSI performance have improved by many orders of magnitude and it has been achieved by the unabated scaling of the sizes of MOSFETs. However, scaling also exacerbates fault, noise and reliability issues, thus posing new challenges in digital circuit design and system. Reliability becomes a major concern due to many and often correlated factors, such as param...

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