Moderne CMOS-Technologien erlauben, als Folge stetig sinkender Strukturbreiten, die Integration komplexer Systeme auf einem Schaltkreis, als System on Chip (SoC). Durch Strukturgrößen unterhalb von 250 nm, dem Deep Sub-Micron-Bereich (DSM), steigt der Einfluss parasitärer Effekte in performanzund leistungsrelevante Größenordungen. Gleichzeitig entwickelt sich die Verlustleistungsaufnahme der So...

The performance of analog and RF circuitry is increasingly sensitive to deep sub-micron manufacturing. Standard devices that are well characterized and modeled are essential to realize stable, working designs without silicon iterations. Potential tradeoffs of device performance for lower processing cost must also be carefully assessed. A methodology and supporting circuit and device IP is descr...

The need for development of new approaches for defect/fault analysis of VLSI circuit is growing and becomes even more important as we move further into the sub-micron devices. Yield loss in ICs fabrication and testing of the manufactured ICs now are major bottlenecks in the production of qualitative VLSI circuits. For instance, it is predicted that the test costs for the emerging deep submicron...

Ce rapport technique peut-être repéré par auteur et par titre dans le catalogue de la Bibliothèque : High-performance clocking of IPs, within a skew budget, is becoming difficult in Deep Sub-Micron technologies. Therefore, the concept of local islands of independent clocks prevails in SoCs, which can communicate using various synchronous and asynchronous interfacing methodologies. However, asyn...

Background & Objectives: Odontogenic cysts are among the most frequent destructive lesions of jaws which their pathogenesis and growth mechanism are not cleared. With respect to different roles of mast cells, they may play a role in the pathogenesis and growth of odontogenic cysts. The aim of present study was to evaluate mast cells in the most common odontogenic cyst. Methods:</e...

Recent technology improvements are leading to significant advances in telecommunications. New sub-micron technologies allow us to design high speed digital processors and high-speed, high-resolution data converters. These basic components push the analog-digital border close to the antenna and favor the implementation of complex digital algorithms. Various system architectures are examined and ...

We present a simple and efficient method for the extraction of thermal channel noise of MOS FET’s in quarter and sub-quarter micron technologies from NF50 (noise figure at 50 Ohm source resistance) measurements. For shorter channel lengths the experimental results shows a continuously rising deviation from the classical long channel theory [1]. For a 0.18 μm technology a γ≈6 instead of 2/3 in s...