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To improve measurements of the dielectric permittivity of nanometric portions by means of Local Dielectric Spectroscopy (LDS), we introduce an extension to current analytical models for the interpretation of the interaction between the probe tip of an electrostatic force microscope (EFM) and a thin dielectric film covering a conducting substrate. Using the proposed models, we show how more accu...

thin film phthalocyanines(pc), incloding zinc, iron, and magnesium phthalocyani-nes, were prepared by vacuum deposition method. chronocoulometry was used to study the charge transfer reaction mechanism of ionic species through the thin films. the results obtained in chronocoulometric studies shows that the thin film phthalocyanines could operate via two mechanisms.the first mechanism metal pc t...

Thin film transistor circuits using organic semiconductors (oTFT) have received intense interest for applications requiring structural flexibility, large area coverage, low temperature processing, and low-cost [1]. Pentacene TFTs have demonstrated the highest performance among TFTs with an organic semiconductor channel. A major limitation, however, has been unusually high operating voltages (20...

In this paper, the results of the modeling calculations carried out for predicting the interference effects expected in the sum frequency generation (SFG) spectra of a specific thin-layer system, described in the accompanying paper, are tested by comparing them with the experimental spectra obtained for a real thin-layer film comprising an organic monolayer/variable thickness dielectric layer/g...

In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations. This method allows to characterize the dielectric properties of materials without any restrictions of film thickness, tip radius and tip-sample distance. The EFM experiments consist in the detection of the e...

Submitted for the MAR09 Meeting of The American Physical Society Mechanics of nanoscale composite films from stress-electrical measurements: A nanoscale foam CHIEU NGUYEN, VIVEK MAHESHWARI, RAVI SARAF, CHEMICAL ENGINEERING-UNIVERSITY OF NEBRASKALINCOLN TEAM — Nanometer thin (> 100nm) composite films consisting of polymers and organic-inorganic materials such as nanoparticles, quantum dots, nano...

The design of multilayer stack of dielectric films for narrow band mirror is developed using thin film coating software. The proposed design is materialized by employing thin film coating (PVD) method and reflectance in narrow band spectrum range is achieved. Thickness of high and low refractive index material is taken precisely up to nanometer level. The curved coated substrate is cemented wit...