نتایج جستجو برای: ebsd
تعداد نتایج: 1580 فیلتر نتایج به سال:
Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator
Nanomanipulators, whilst commonly used to lift out TEM samples prepared in the FIB, have a number of other potential applications and can aid in the chemical and crystallographic analysis of samples. Here, we discuss some of these alternative uses of nanomanipulators and show how they enable the EDS and EBSD analysis of thin samples in the FIB-SEM as well as serve as electrical probes and enabl...
The microstructure evolution of electroplated copper films was characterized by electron backscatter diffraction (EBSD). Special care was taken during the preparation of the cross-sectional specimens and microstructure analysis to obtain reliable results. The film exhibited a columnar grain structure with a large fraction of twin boundaries. Annealing induced normal grain growth and caused many...
transformation induced plasticity (trip) steels have a vast application in automotive industry because of theirhigh strength, high ductility and hence excellent energy absorption capacity. these characteristics of tripsteels are due to the existence of retained austenite in their microstructures in the ambient temperature, whichtransforms to the martensite phase during deformation. the microstr...
Electron BackScatter Diffraction (EBSD) in conjunction with Field-Emission Environmental Scanning Electron Microscopy (FEG-ESEM) has been used to evaluate the microstructural and local plastic strain evolution in different alloys (AISI 1005, AISI 304L and Duplex 2205) deformed by a single-stage cold and warm forging process. The present work is aimed to describe the different behavior of the au...
In this study we present microstructural data from hydrothermal veins in the sedimentary cover and the igneous basement recovered from Hole U1414A, Integrated Ocean Drilling Program (IODP) Expedition 344 (Costa Rica Seismogenesis Project), to constrain deformation mechanism operating in the subducting Cocos Plate. Cathodoluminescence studies, mechanical e-twin piezometry and electron backscatte...
Commercial purity aluminium at true strains 3 = 2∼ 5.5 was annealed in a wide temperature range (from room temperature to 220◦C), and the evolution of microstructure was characterized using transmission electron microscopy (TEM) and electron backscattered diffraction (EBSD) techniques. Triple junctions in an ultrafine lamellar structure are classified into three categories based on the structur...
We present a fast and versatile algorithm for the reconstruction of the grain structure from 2d and 3d Electron Back Scatter Diffraction (EBSD) data. The algorithm is rigorously derived from the modeling assumption that grain boundaries are located at the bisectors of adjacent measurement locations. This modeling assumption immediately implies that grains are composed of Voronoi cells correspon...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید