نتایج جستجو برای: field optical microscopy

تعداد نتایج: 1184779  

Journal: :Optics letters 2012
Houssine Makhlouf Karen Perronet Guillaume Dupuis Sandrine Lévêque-Fort Arnaud Dubois

Full-field optical coherence microscopy (FF-OCM) and optically sectioned fluorescence microscopy are two imaging techniques that are implemented here in a novel dual modality instrument. The two imaging modalities use a broad field illumination to acquire the entire field of view without raster scanning. Optical sectioning is achie...

Journal: :ACS nano 2012
Danielle R Honigstein Jacques Weinroth Michael Werman Aaron Lewis

An object is characterized by its amplitude and phase. However, when acquiring optical data about such an object, using a recording medium such as a camera, phase information is lost. Crystallography experienced a breakthrough in phase retrieval for large molecular entities by Max Perutz's introduction of "heavy atoms" using the method of isomorphous replacement. The availability of scanning pr...

2013
Alex M. H. Wong George V. Eleftheriades

Optical microscopy suffers from a fundamental resolution limitation arising from the diffractive nature of light. While current solutions to sub-diffraction optical microscopy involve combinations of near-field, non-linear and fine scanning operations, we hereby propose and demonstrate the optical super-microscope (OSM) - a superoscillation-based linear imaging system with far-field working and...

Journal: :ACS nano 2011
Monika Fleischer Alexander Weber-Bargioni M Virginia P Altoe Adam M Schwartzberg P James Schuck Stefano Cabrini Dieter P Kern

Near-field scanning optical microscopy enables the simultaneous topographical and subdiffraction limited optical imaging of surfaces. A process is presented for the implementation of single individually engineered gold cones at the tips of atomic force microscopy cantilevers. These cantilevers act as novel high-performance optical near-field probes. In the fabrication, thin-film metallization, ...

Journal: :Optics express 2015
Yan Li Nan Zhou Arvind Raman Xianfan Xu

Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher verti...

Journal: :BioTechniques 2000
K W Dunn E Wang

Refinements in design have simplified confocal microscopy to the extent that it has become a standard research tool in cell biology. However, as confocal microscopes have become more powerful, they have also become more demanding of their optical components. In fact, optical aberrations that cause subtle defects in image quality in wide-field microscopy can have devastating effects in confocal ...

Journal: :Analytical chemistry 2002
Youngmi Lee Allen J Bard

A technique that combines scanning electrochemical microscopy (SECM) and optical microscopy (OM) was implemented with a new probe tip. The tip for scanning electrochemicaVoptical microscopy (SECM/OM) was constructed by insulating a typical gold-coated near-field scanning optical microscopy tip using electrophoretic anodic paint. Once fabricated, the tip was characterized by steady-state cyclic ...

2010
Yong Wang Chia-Yu Lin Alexei Nikolaenko Varun Raghunathan Eric O. Potma

The basics of four-wave mixing (FWM) and recent advances in FWM microscopy are reviewed with a particular emphasis on applications in the field of nanomaterials. The vast progress in nanostructure synthesis has triggered a need for advanced analytical tools suitable to interrogate nanostructures one at a time. The single-nanostructure sensitivity of optical microscopy has solidified the optical...

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