− There’re mainly two different situations for testing PLD (Programmable Logic Device) devices. One is testing of blank chips that haven’t been programmed; the other is testing of ASIC (Application Specific Integrated Circuit) devices that have been programmed. This paper presents a test method for programmed ASIC devices, including auto test and ATPG (Auto Test Pattern Generation) method for b...

Taiwan’s integrated circuit (IC) industry development process can be separated into three stages: the initiation stage, consisting of obtaining technology and facilitating setup of domestic companies; the burgeoning stage, consisting of the formation of manufacturer’s R&D abilities; and the growth stage, consisting of further raising an industry’s international competitive levels. In each stage...

Applied research on growth and innovation seems to suggest that successful innovations do not significantly enhance firm growth. This paper tests the hypothesis that the level of observation at which applied research is typically conducted hampers identification of a significant association between innovation and sales growth rates. Exploiting a unique data set, we find that product innovations...

A current controllable current-mode universal filter with four inputs and one output employing multi-output current-controlled current conveyors (MOCCCIIs) is described. The proposed circuit offers the following attractive features: employment the minimum number of active and passive components, i.e., two MOCCCIIs and two grounded capacitors; simultaneous realization of all the standard filteri...