Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. In contrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local refineme...

One of the most fundamental questions in tribology concerns the area dependence of friction at the nanoscale. Here, experiments are presented where the frictional resistance of nanoparticles is measured by pushing them with the tip of an atomic force microscope. We find two coexisting frictional states: While some particles show finite friction increasing linearly with the interface areas of up...

This article considers the precision positioning problem associated with high-speed operation of the Atomic Force Microscope (AFM), and presents an inversion-based control approach to achieve precision positioning. Although AFMs have high (nanoscale) spatial resolution, a problem with current AFM systems is that they have low temporal resolution, i.e., AFM imaging is slow. In particular, curren...

We describe a scanning mirage microscope system that uses a diode probe laser. The sample is raster scanned using X-Y motorised microstepping stages under an Ar+ pump beam to give two dimensional scans and depth profiles. The results for a test sample are given and are compared to that obtained by scanning using a conventional large photoacoustic (PA) cell.

Using monochromated electron energy loss spectroscopy in a probe-corrected scanning transmission electron microscope we demonstrate band gap mapping in ZnO/ZnCdO thin films with a spatial resolution below 10 nm and spectral precision of 20 meV.

Electronic confinement at nanoscale dimensions remains a central means of science and technology. We demonstrate nanoscale lateral confinement of a quasi-two-dimensional electron gas at a lanthanum aluminate-strontium titanate interface. Control of this confinement using an atomic force microscope lithography technique enabled us to create tunnel junctions and field-effect transistors with char...

A substrate coated with an achiral polyimide alignment layer was scribed bidirectionally with the stylus of an atomic force microscope to create an easy axis for liquid crystal orientation. The resulting noncentrosymmetric topography resulted in a chiral surface that manifests itself at the molecular level. To show this unambiguously, a planar-aligned negative dielectric aniostropy achiral nema...

Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the cantilever dynamics is conditionally stable and that there is a direct link between the frequency shift and the conservative tip-sample interaction. However, a soft coupling between the electronics and the nonlinearity of the interaction may signi...

Stochastic on-off conductivity switching observed in phenylene-ethynylene oligomers has been explained in terms of changes in ring conformations, or electron localization, or both. We report the observation of stochastic on-off switching in the simplest of wired molecules: octanedithiol, decanedithiol, and dodecanedithiol bonded on an Au(111) surface. Stochastic switching was observed even when...

We model friction acting on the tip of an atomic force microscope as it is dragged across a surface at nonzero temperatures. We find that stick-slip motion occurs and that the average frictional force follows (absolute value lnv)(2/3), where v is the tip velocity. This compares well to recent experimental work, permitting the quantitative extraction of all microscopic parameters. We calculate t...