This article presents a new methodology to extract, at given operation condition, the statistical distribution of number active defects that contribute observed device time-dependent variability, as well their amplitude distribution. Unlike traditional approaches based on complex and time-consuming individual analysis thousands current traces, proposed approach uses simpler trace processing, si...

In this article, we present a general statistical parts-based model for representing the appearance of an image set, applied to the problem of inter-subject MR brain image matching. In contrast with global image representations such as active appearance models, the parts-based model consists of a collection of localized image parts whose appearance, geometry and occurrence frequency are quantif...

The variabilities of device characteristics are usually regarded as a normal distribution. If we consider the variabilities over the whole wafer, however, they cannot be expressed as a normal distribution due to the existence of global systematic component. We propose a statistical model, characterizing the global systematic component according to the distance from the center of the wafer, whic...

1. Abstract We have studied the statistical variability (SV) in thinbody silicon-on-insulator (TBSOI) MOSFETs with high-κ/metal gate stacks. We have considered the impact of the gate workfunction variation (WFV) in conjunction with random discrete dopants (RDD) and trapped interface charges. The simulations were carried with the Glasgow 3D ’atomistic’ simulator GARAND. Results for both threshol...

We propose to increment a statistical shape model with surrogate variables such as anatomical measurements and patient-related information, allowing conditioning the shape distribution to follow prescribed anatomical constraints. The method is applied to a shape model of the human femur, modeling the joint density of shape and anatomical parameters as a kernel density. Results show that it allo...

ROBERT ELIJAH BROADHURST: Compact Appearance in Object Populations Using Quantile Function Based Distribution Families (Under the direction of Stephen M. Pizer) Statistical measurements of the variability of probability distributions are important in many image analysis applications. For instance, let the appearance of a material in a picture be represented by the distribution of its pixel valu...

We describe a numerical model for chip level lithography variability analysis. Gate level critical dimensions are adjusted based on lithographic variability simulations and these perturbed gate lengths are input to a chip timing analyzer. Statistical modeling studies highlight the interaction between lithography variability and chip timing performance including the role of lithography error cor...

This paper proposes a model to calculate statistical gate-delay variation caused by intra-chip and inter-chip variabilities. The variation of each gate delay directly influences the circuitdelay variation, so it is important to characterize each gate-delay variation accurately. Every transistor in a gate affects transient characteristics of the gate, so it is indispensable to consider an intrag...

The magnitude of the Sun’s influence on climate has been a subject of intense debate. Estimates of this magnitude are generally based on assumptions regarding the forcing due to solar irradiance variations entering climate modelling. Given the complexity of the climate system, however, such modelling is perforce based on simplifying assumptions, which leaves it open to criticism. We take a comp...