Processing data and displaying numerical values are some of the most important engineering aspects. Microcontrollers, such as Arduino, are important tools for analyzing data wirelessly with the help of a Wi-Fi Shield. This paper will be focused on designing a simple Wi-Fi communication analyzer using Arduino microcontroller so that it interacts with Wi-Fi Shield and display numerical results of...

A novel approach to increase the measurement range of the optical vector network analyzer (OVNA) based on optical single-sideband (OSSB) modulation is proposed and experimentally demonstrated. In the proposed system, each comb line in an optical frequency comb (OFC) is selected by an optical filter and used as the optical carrier for the OSSB-based OVNA. The frequency responses of an optical de...

Abstract This paper briefly introduces the structure and working principle of electric field sensor. And a conductive sensor for measuring sub-nanosecond voltage pulse is designed. The consists coaxial transition section integrated probe. N-type connector SMA are selected input/direct output port coupling respectively. equivalent antenna area measured by vector network analyzer about 0.035cm2, ...

We present a method for measuring the complete linear response, including amplitude, phase, and polarization, of a fiber-optic component or assembly that requires only a single scan of a tunable laser source. The method employs polarization-diverse swept-wavelength interferometry to measure the matrix transfer function of a device under test. We outline the theory of operation to establish how ...

A novel optical vector network analyzer (OVNA) based on optical single-sideband (OSSB) modulation and balanced photodetection is proposed and experimentally demonstrated, which can eliminate the measurement error induced by the high-order sidebands in the OSSB signal. According to the analytical model of the conventional OSSB-based OVNA, if the optical carrier in the OSSB signal is fully suppre...

We present a method based on a Fabry-Perot model to efficiently and accurately estimate optical constants of wafer samples in transmission-only measurements performed by a vector network analyzer (VNA). The method is demonstrated on two separate wafer samples: one of silicon and the other of polymethylmethacrylate. Results show that the method can not only acquire optical constants accurately a...

An approach to suppress the measurement errors induced by the high-order sidebands of the optical single-sideband (OSSB) signal in the OSSB-based optical vector network analyzer (OVNA) is proposed and experimentally demonstrated. An analytical model for studying the measurement errors of the OSSB-based OVNA is established. Results show that the measurement errors introduced by the high-order si...

− Recently, a novel approach for the estimation of the residual error parameters of a calibrated vector network analyzer has been proposed. The method is based on a reflection measurement employing a high precision airline terminated by a short. From this measurement the complex valued residual error parameters are calculated utilizing a sophisticated data analysis scheme. In this work the unce...

This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar waveguide probes and vector network analyzer were used to measure the dielectric constant versus frequency of thin films of lead zirconate titanate and zirconium titanate, fabricated by sol gel methods. One-step lithography w...

A broadband microwave spectrometer has been constructed to determine the complex conductivity of thin metal films at frequencies from 45 MHz to 20 GHz working in the temperature range from 0.45 K to 2 K (in a (3)He cryostat). The setup follows the Corbino approach: a vector network analyzer measures the complex reflection coefficient of a microwave signal hitting the sample as termination of a ...