نتایج جستجو برای: voltage drop
تعداد نتایج: 152278 فیلتر نتایج به سال:
This work reports current efforts in developing experimental techniques applicable for thermoelectric properties characterization at micro and nanoscale. A one-dimensional transport model was used to asses the effects of heat leakage, non-symmetric boundary conditions, and electrical contact resistance, on thermoelectric properties measurements performed by transient Harman method. If the above...
In conventional direct torque control (DTC), the stator flux is usually kept constant by controlling the x-axis component of the stator voltage in the stator flux reference frame. The torque is then controlled by the y-axis component of stator voltage. In this scenario, the stator current does not exceed its permissible value. However, in the so-called optimal efficiency mode, the induction mot...
this thesis is presented 10 ghz voltage controlled ring oscillator for high speed application. the voltage controlled ring oscillator was designed and fabricated in 0.13یm cmos technology. the oscillator is 7-stages ring oscillator with one inverter replaced by nand-gate for shutting down in the ring oscillator during idle mode. tri-state inverter was used to control of 126 bit vector in ri...
We studied the local voltage drop in functionalized graphene sheets of subμm size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic current-voltage characteristics and an intrinsic conductivity of about 3.7 × 10(5) S/m corresponding to a sheet resistance of 2.7 kΩ/sq under ambient conditions for graphene produced via...
We study interlayer tunnelling in some double-layered quantum Hall states that contain neutral gapless superfluid mode. A tunnelling current less than a certain critical value will not cause any voltage drop between the two layers. A finite voltage V between the layers will induce an AC current with a frequency ω = eV/h̄. In contrast to tunnelling between superconductors, the critical current he...
Chips that produce correct results under operating conditions are called good chips. Some good chips may fail structural tests applied via scan chains (also called overkill chips). A reduction in supply voltage (also called supply voltage droop) due to the resistance of power-ground network is called IR-drop. IR-drop is investigated as a potential cause of overkill. IR-drop may slow down the sp...
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