نتایج جستجو برای: 46 for testing

تعداد نتایج: 10456336  

Journal: :Turkish Journal of Endocrinology and Metabolism 2013

Journal: :Electronic Journal of General Medicine 2012

Journal: :Journal of Japan Society of Computer Aided Surgery 2009

Journal: :Advanced Materials 2022

Advanced MaterialsVolume 34, Issue 46 2270315 Cover PictureFree Access (Adv. Mater. 46/2022) First published: 17 November 2022 https://doi.org/10.1002/adma.202270315AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text full-text accessPlease review our Terms and Conditions of Use check box below share version article.I have read acce...

Journal: :Schweizerische Ärztezeitung = 2022

Journal: :hepatitis monthly 0
wai kay seto department of medicine, university of hong kong, queen mary hospital, china ching lung lai department of medicine, university of hong kong, queen mary hospital, china man fung yuen department of medicine, university of hong kong, queen mary hospital, china +852-22553984, [email protected]; department of medicine, university of hong kong, queen mary hospital, china +852-22553984, [email protected]

2011
Praveen Kumar Aggarwal Vandana Yadav Arti Noor

In this paper, we will present a method to reduce the power consumption during testing of a circuit-under-test (CUT). In proposed scheme the power reduced in two steps. In first step power reduced using gated clock design approach and in second step reduces the no of reduces the number of transitions at the inputs of the circuit-under-test. KeywordsLFSR, Clock gating, Bit swapping, Bilt-in-self...

2003
Amund Tveit

This paper presents a factorial experimental design for testing which factors controlling the scalability of the Zereal Massively Multiplayer Online Game simulator. The analysis show that the factors explain approximately 97% of the model (measured in square of errors), which is surprisingly high since the simulation is stochastic.

2018

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

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