نتایج جستجو برای: atomic force microscope
تعداد نتایج: 298371 فیلتر نتایج به سال:
Journal:
:Material Science Research India
2020
Journal:
:IEEJ Transactions on Electronics, Information and Systems
2002
Journal:
:Nano Hybrids
2013
Journal:
:Review of Scientific Instruments
2005
2014
Alexandra Radenovic
Eva Bystrenova
Laurent Libioulle
Francesco Valle
George T. Shubeita
Sandor Kasas
Giovanni Dietler
Articles you may be interested in In-situ scanning electron microscopy and atomic force microscopy Young's modulus determination of indium oxide microrods for micromechanical resonator applications Appl. Cantilever temperature characterization in low temperature vacuum atomic force microscope Rev. Low-temperature atomic force microscope using piezoresistive cantilevers Rev. Different types of a...
Journal:
:Review of Scientific Instruments
2019
Journal:
:Applied Physics Letters
2011
Journal:
:Beilstein Journal of Nanotechnology
2011
Journal:
:Biophysical Journal
1997
Journal:
:Procedia Engineering
2012
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