نتایج جستجو برای: atomic force microscopy

تعداد نتایج: 425871  

Journal: :Beilstein Journal of Nanotechnology 2014

Journal: :International Journal of Mycobacteriology 2015

Journal: :Microscopy and Microanalysis 2017

2008
Pranav Agarwal Murti V. Salapaka

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...

Journal: :Analytical Chemistry 2005

Journal: :Beilstein Journal of Nanotechnology 2016

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