نتایج جستجو برای: birefringent thin film

تعداد نتایج: 188369  

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه شیراز - دانشکده علوم 1385

چکیده ندارد.

Journal: :journal of nanostructures 2012
a. bahari

the main impetus for our research is provided by the growing interest worldwide in ultra thin silicon dioxide on silicon based nano devices. the obvious need for better knowledge in the ultra thin gate silicon dioxides, is motivated both by interests in fundamental research and phenomenology as well as by interests in possible applications, which can be found with better fitting of experimental...

Journal: :journal of membrane science and research 0
iman khalilinejad membrane processes research laboratory (mprl), department of chemical engineering, amirkabir university of technology (tehran polytechnic), mahshahr campus, mahshahr, p.o. box 415, iran hamidreza sanaeepur membrane processes research laboratory (mprl), department of chemical engineering, amirkabir university of technology (tehran polytechnic), mahshahr campus, mahshahr, p.o. box 415, iran ali kargari membrane processes research laboratory (mprl), department of chemical engineering, amirkabir university of technology (tehran polytechnic), mahshahr campus, mahshahr, p.o. box 415, iran

in this work, novel thin film composite membranes (tfcs) of poly (ether-6-block amide) (pebax-1657) on a polyvinyl chloride (pvc) ultrafiltration membrane as support were prepared using inclined coating method for co2 separation. investigating the effects of top selective layer thickness formed by controlling the coating angle (15-60°) and polymer solution concentration (5-10 wt.%), and also, t...

2014
Chia-Hsin Chou I-Che Lee Po-Yu Yang Ming-Jhe Hu Chao-Lung Wang Chun-Yu Wu Yun-Shan Chien Kuang-Yu Wang Huang-Chung Cheng

Articles you may be interested in A model of electrical conduction across the grain boundaries in polycrystalline-silicon thin film transistors and metal oxide semiconductor field effect transistors Polycrystalline silicon thin-film transistors with location-controlled crystal grains fabricated by excimer laser crystallization Appl. Improvement of the electrical performance in metal-induced lat...

2014
Jaeman Jang Dae Geun Kim Dong Myong Kim Sung-Jin Choi Jun-Hyung Lim Je-Hun Lee Yong-Sung Kim Byung Du Ahn Dae Hwan Kim

Articles you may be interested in A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under simultaneous negative gate bias and illumination Instability of amorphous hafnium-indium-zinc-oxide thin film transistors under negative-bias-illumination stress Appl. Investigation of zinc interstitial ions as the origin of anomalo...

M. H. Habibi M. Khaledi Sardashti

In this paper, ZnO thin film is deposited on slide glass substrate using the sol-gel process. Presenting well-defined orientation of ZnO thin films Nanostructure were obtained by dip coating of zinc acetate dihydrate, monoethanolamine (MEA), de-ionized water and isopropanol alcohol. The annealed ZnO thin films were transparent ca 85-90% in visible range with an absorption edges at about 375 nm....

2006
Z. Meng Zhiguo Meng Dongli Zhang Chunya Wu Bo Zhang Hoi-Sing Kwok Man Wong

Post-crystallization heat-treatment of metal-induced laterally crystallized polycrystalline silicon thin film using YAG solid-state laser is characterized. It is found that both the material quality and the TFT performance are related to the laser-treatment condition. The amorphous silicon fraction remaining in the polycrystalline thin film can be reduced and the performance of the thin-film tr...

Journal: :Journal of nanoscience and nanotechnology 2010
Tao Jiang Weiping Qin Fuheng Ding

A calcium fluoride thin film co-doped with Yb3+/Tm3+ was deposited on Si substrates by the spin-coating method using trifluoroacetic acid as a fluorine source. The scanning electron microscopy (SEM) image of the sample showed that a thin film with some cracks was formed. After annealing, the cracks disappeared, and the film became thinner. The roughness of the thin film was about 150 nm, which ...

Journal: :ElectroComponent Science and Technology 1983

Journal: :IBM Journal of Research and Development 2009
Kartik Srinivasan Sanjay Goyal Thomas Siegmund Ganesh Subbarayan Qinghuang Lin

Thermally induced film wrinkling is a fabrication and reliability challenge for thin-film stacks consisting of a compliant film capped by a stiffer film. The current understanding of film wrinkling is largely restricted to thin-film stacks on blanket substrates. An understanding of wrinkling in thin-film stacks on patterned substrates is of greater practical relevance to the microelectronic ind...

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