نتایج جستجو برای: cost performance
تعداد نتایج: 1370696 فیلتر نتایج به سال:
Energy, exergy and exergoeconomic (3E) evaluation are performed to assess the performance of a NH3/H2O cycle integrated with parabolic trough solar collectors (PTSC). To provide continuous electricity produced by generator when solar beam radiation is insufficient a stabilizer temperature subsystem is utilized. The major thermodynamic parameters and climate conditions variations are selected to...
Purpose: High maintenance cost is the common issue in building industry due to low service quality of maintenance management in Malaysia. Lack of preventive measure is the problem that implicates poor maintenance performance. Scheduled maintenance is suggested to improve the maintenance performance. However, the effectiveness of scheduled maintenance can be greatly influenced by the availabilit...
In high-performance computing symbolic cost estimation is an important engineering tool that allows rapid insight in the performance effects of coding or data partitioning alternatives. In this paper we present an automatic cost estimator that compiles data parallel programs into symbolic performance models of very low solution complexity. With minimal program annotation by the user, symbolic c...
quires routine analysis of large 3D (or even higher) data sets. Often, complex geometry is an integral component of the problem’s complexity, so it is only natural to apply 3D visual analysis in combination with more traditional analysis and diagnostic techniques. Recent advances in computer technology have pushed conventional desktop computers to the point where scientific visualization is fea...
Envisioning the healthcare technology of tomorrow requires one to break from the mainstream and explore alternative approaches to develop accessible, ubiquitous diagnostic tools. In the field of magnetic resonance imaging (MRI), despite considerable improvements in imaging quality and speed, the underlying technology remains remarkably unchanged compared to the first generation scanners that em...
Ð This paper describes a methodology for building models predicting manufactured integrated circuit performances as a function of inline and wafer electrical test measurements. We show how these predictions can be used to predict the performance of an industrial microprocessor, and reduce the average number of speed bins that must be tested by 45%.
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